Transmission Electron Microscopy: A Textbook for Materials Science

by David B. Williams, C. Barry Carter

Publisher: Springer
ISBN: 0387765026

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Book Description

This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment.

Key Features:

• Undisputed market leader, now completely revised and updated
• Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists
• Explains why a particular technique should be used and how a specific concept can be put into practice
• Nearly 700 figures and diagrams, most in full color

Book Reviews

“This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. … There are an abundant number of references at the end of each chapter for further study … . This is an outstanding book … .” (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)

“D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. … This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered … the book relevant to his projects will be well armed for battle. … Buy this book!” (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)

Customer Reviews

This set of textbooks include almost every aspect and technique in TEM and related fields. Readers from different levels can benefit by referencing the relevant part according to their specific interests/questions. However, from my point of view, some widely applied techniques/methodologies, e.g. for the for the High resolution imaging processing, the basics of image filtering, the geometric phase analysis (GPA) should be included. However, it is no doubt this set is the best and most comprehensive TEM reference book up to date.

This textbook is a fantastic introduction to transmission electron microscopy because of the informal, lecture-like layout of each chapter. The authors do not assume anything more than a basic knowledge of physics and optics and so describe in vivid detail what is happening in each chapter. There are numerous informal comments and asides that evoke an informal tone, sorely missing from the many pompous textbooks that abound in this field.

I would highly recommend the text to anyone looking for a basic introduction to the different kinds of transmission electron microscopy available and a thorough treatment of the physics and optics of these microscopes.